# Investigation of Random Telegraph Noise Under Different Programmed Cell V<sub>t</sub> Levels in Charge Trap Based 3D NAND Flash

> Research article (IEEE Electron Device Letters, 2022) · cited 19× · AI/ML

**Wikidata**: [openalex:W4225484432](https://www.wikidata.org/wiki/openalex:W4225484432)  
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