# Investigation of Program Noise in Charge Trap Based 3D NAND Flash Memory

> Research article (IEEE Electron Device Letters, 2019) · cited 20× · AI/ML

**Wikidata**: [openalex:W2991475161](https://www.wikidata.org/wiki/openalex:W2991475161)  
**Source**: https://4ort.xyz/entity/investigation-of-program-noise-in-charge-trap-based-3d-nand-flash-memory