# Investigation of Preexisting and Generated Defects in Nonfilamentary a-Si/TiO<sub>2</sub> RRAM and Their Impacts on RTN Amplitude Distribution

> Research article (IEEE Transactions on Electron Devices, 2018) · cited 13× · AI/ML

**Wikidata**: [openalex:W2789248677](https://www.wikidata.org/wiki/openalex:W2789248677)  
**Source**: https://4ort.xyz/entity/investigation-of-preexisting-and-generated-defects-in-nonfilamentary-a-si-tio-sub-2-sub-rram-and-their-impacts-on-rtn-am