# Investigation of Noise Characteristics in Gate-Source Overlap Tunnel Field-Effect Transistor

> Research article (Silicon, 2022) · cited 14× · AI/ML

**Wikidata**: [openalex:W4220903023](https://www.wikidata.org/wiki/openalex:W4220903023)  
**Source**: https://4ort.xyz/entity/investigation-of-noise-characteristics-in-gate-source-overlap-tunnel-field-effect-transistor