# Investigation of Low-Frequency Noise in Nonvolatile Memory Composed of a Gate- All-Around Junctionless Nanowire FET

> Research article (IEEE Transactions on Electron Devices, 2016) · cited 19× · AI/ML

**Wikidata**: [openalex:W2329693300](https://www.wikidata.org/wiki/openalex:W2329693300)  
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