# Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems

> Research article (2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2020) · cited 21× · AI/ML

**Wikidata**: [openalex:W3101180997](https://www.wikidata.org/wiki/openalex:W3101180997)  
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