# Intermittency-induced criticality in the random telegraph noise of nanoscale UTBB FD-SOI MOSFETs

> Research article (Microelectronic Engineering, 2019) · cited 10× · AI/ML

**Wikidata**: [openalex:W2947035199](https://www.wikidata.org/wiki/openalex:W2947035199)  
**Source**: https://4ort.xyz/entity/intermittency-induced-criticality-in-the-random-telegraph-noise-of-nanoscale-utbb-fd-soi-mosfets