# Interface percolation and random trap generation in ferroelectric memory: A two-step degradation mechanism explored through low-frequency noise spectroscopy

> Research article (Chaos Solitons & Fractals, 2025) · cited 10× · AI/ML

**Wikidata**: [openalex:W4411542449](https://www.wikidata.org/wiki/openalex:W4411542449)  
**Source**: https://4ort.xyz/entity/interface-percolation-and-random-trap-generation-in-ferroelectric-memory-a-two-step-degradation-mechanism-explored-throu