# Interconnect scaling challenges, and opportunities to enable system-level performance beyond 30 nm pitch

> Research article (2020 IEEE International Electron Devices Meeting (IEDM), 2020) · cited 30× · AI/ML

**Wikidata**: [openalex:W3138990781](https://www.wikidata.org/wiki/openalex:W3138990781)  
**Source**: https://4ort.xyz/entity/interconnect-scaling-challenges-and-opportunities-to-enable-system-level-performance-beyond-30-nm-pitch