# Integrating content-based image retrieval and deep learning to improve wafer bin map defect patterns classification

> Research article (Journal of Industrial and Production Engineering, 2022) · cited 14× · AI/ML

**Wikidata**: [openalex:W4280576345](https://www.wikidata.org/wiki/openalex:W4280576345)  
**Source**: https://4ort.xyz/entity/integrating-content-based-image-retrieval-and-deep-learning-to-improve-wafer-bin-map-defect-patterns-classification