# Inspecting surface mounted devices using k nearest neighbor and Multilayer Perceptron

> Research article (2015 IEEE 24th International Symposium on Industrial Electronics (ISIE), 2015) · cited 13× · AI/ML

**Wikidata**: [openalex:W1661932126](https://www.wikidata.org/wiki/openalex:W1661932126)  
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