# Industrial defective chips detection using deep convolutional neural network with inverse feature matching mechanism

> Research article (Journal of Computational Design and Engineering, 2024) · cited 11× · AI/ML

**Wikidata**: [openalex:W4399711193](https://www.wikidata.org/wiki/openalex:W4399711193)  
**Source**: https://4ort.xyz/entity/industrial-defective-chips-detection-using-deep-convolutional-neural-network-with-inverse-feature-matching-mechanism