# In-depth Characterization of Resistive Memory-Based Ternary Content Addressable Memories

> Research article (2018 IEEE International Electron Devices Meeting (IEDM), 2018) · cited 22× · AI/ML

**Wikidata**: [openalex:W2914944725](https://www.wikidata.org/wiki/openalex:W2914944725)  
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