# Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests

> Research article (2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2018) · cited 19× · AI/ML

**Wikidata**: [openalex:W2909734121](https://www.wikidata.org/wiki/openalex:W2909734121)  
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