# Improved Wafer Map Inspection Using Attention Mechanism and Cosine Normalization

> Research article (Machines, 2022) · cited 28× · AI/ML

**Wikidata**: [openalex:W4213243056](https://www.wikidata.org/wiki/openalex:W4213243056)  
**Source**: https://4ort.xyz/entity/improved-wafer-map-inspection-using-attention-mechanism-and-cosine-normalization