# Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs

> Research article (IEEE Transactions on Nuclear Science, 2021) · cited 12× · AI/ML

**Wikidata**: [openalex:W3136157274](https://www.wikidata.org/wiki/openalex:W3136157274)  
**Source**: https://4ort.xyz/entity/impacts-of-through-silicon-vias-on-total-ionizing-dose-effects-and-low-frequency-noise-in-finfets