# Impacts of Machine Learning on Counterfeit IC Detection and Avoidance Techniques

> Research article (2020 21st International Symposium on Quality Electronic Design (ISQED), 2020) · cited 17× · AI/ML

**Wikidata**: [openalex:W3041142214](https://www.wikidata.org/wiki/openalex:W3041142214)  
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