# Impact of time-zero and NBTI variability on sub-20nm FinFET based SRAM at low voltages

> Research article (2015 IEEE International Reliability Physics Symposium, 2015) · cited 24× · AI/ML

**Wikidata**: [openalex:W1577725099](https://www.wikidata.org/wiki/openalex:W1577725099)  
**Source**: https://4ort.xyz/entity/impact-of-time-zero-and-nbti-variability-on-sub-20nm-finfet-based-sram-at-low-voltages