# Impact of temperature variation on noise parameters and HCI degradation of Recessed Source/Drain Junctionless Gate All Around MOSFETs

> Research article (Microelectronics Journal, 2023) · cited 24× · AI/ML

**Wikidata**: [openalex:W4320730841](https://www.wikidata.org/wiki/openalex:W4320730841)  
**Source**: https://4ort.xyz/entity/impact-of-temperature-variation-on-noise-parameters-and-hci-degradation-of-recessed-source-drain-junctionless-gate-all-a