# Impact of temperature on the amplitude of RTN fluctuations in 3-D NAND flash cells

> Research article (2017 IEEE International Electron Devices Meeting (IEDM), 2017) · cited 20× · AI/ML

**Wikidata**: [openalex:W2773955130](https://www.wikidata.org/wiki/openalex:W2773955130)  
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