# Impact of Noise and Interface Trap Charge on a Heterojunction Dual-Gate Vertical TFET Device

> Research article (Journal of Electronic Materials, 2024) · cited 11× · AI/ML

**Wikidata**: [openalex:W4391602275](https://www.wikidata.org/wiki/openalex:W4391602275)  
**Source**: https://4ort.xyz/entity/impact-of-noise-and-interface-trap-charge-on-a-heterojunction-dual-gate-vertical-tfet-device