# Impact of Memory Voltage Scaling on Accuracy and Resilience of Deep Learning Based Edge Devices

> Research article (IEEE Design and Test, 2019) · cited 14× · AI/ML

**Wikidata**: [openalex:W2981179802](https://www.wikidata.org/wiki/openalex:W2981179802)  
**Source**: https://4ort.xyz/entity/impact-of-memory-voltage-scaling-on-accuracy-and-resilience-of-deep-learning-based-edge-devices