# Impact of Hot Carrier Aging on the 1/f and Random Telegraph Noise of Short-Channel Triple-Gate Junctionless MOSFETs

> Research article (IEEE Transactions on Device and Materials Reliability, 2021) · cited 12× · AI/ML

**Wikidata**: [openalex:W3197190851](https://www.wikidata.org/wiki/openalex:W3197190851)  
**Source**: https://4ort.xyz/entity/impact-of-hot-carrier-aging-on-the-1-f-and-random-telegraph-noise-of-short-channel-triple-gate-junctionless-mosfets