# Impact of DC and RF non-conducting stress on nMOS reliability

> Research article (2015 IEEE International Reliability Physics Symposium, 2015) · cited 13× · AI/ML

**Wikidata**: [openalex:W1493043592](https://www.wikidata.org/wiki/openalex:W1493043592)  
**Source**: https://4ort.xyz/entity/impact-of-dc-and-rf-non-conducting-stress-on-nmos-reliability