# Image quality enhancement of a CD-SEM image using conditional generative adversarial networks

> Research article (Metrology, Inspection, and Process Control for Microlithography XXXIII, 2019) · cited 17× · AI/ML

**Wikidata**: [openalex:W2924963641](https://www.wikidata.org/wiki/openalex:W2924963641)  
**Source**: https://4ort.xyz/entity/image-quality-enhancement-of-a-cd-sem-image-using-conditional-generative-adversarial-networks