# Image processing of die attach's X-ray images for automatic voids detection and evaluation

> Research article (2016 39th International Spring Seminar on Electronics Technology (ISSE), 2016) · cited 12× · AI/ML

**Wikidata**: [openalex:W2522568054](https://www.wikidata.org/wiki/openalex:W2522568054)  
**Source**: https://4ort.xyz/entity/image-processing-of-die-attach-s-x-ray-images-for-automatic-voids-detection-and-evaluation