# Identifying Wafer-Level Systematic Failure Patterns via Unsupervised Learning

> Research article (IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2017) · cited 27× · AI/ML

**Wikidata**: [openalex:W2737795851](https://www.wikidata.org/wiki/openalex:W2737795851)  
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