# Hysteresis modeling with frequency-separation-based Gaussian process and its application to sinusoidal scanning for fast imaging of atomic force microscope

> Research article (Sensors and Actuators A Physical, 2020) · cited 25× · AI/ML

**Wikidata**: [openalex:W3032122877](https://www.wikidata.org/wiki/openalex:W3032122877)  
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