# Hybrid Feature Selection for Wafer Acceptance Test Parameters in Semiconductor Manufacturing

> Research article (IEEE Access, 2020) · cited 38× · AI/ML

**Wikidata**: [openalex:W2999735491](https://www.wikidata.org/wiki/openalex:W2999735491)  
**Source**: https://4ort.xyz/entity/hybrid-feature-selection-for-wafer-acceptance-test-parameters-in-semiconductor-manufacturing