# High‐Temporal‐Resolution Characterization Reveals Outstanding Random Telegraph Noise and the Origin of Dielectric Breakdown in h‐BN Memristors

> Research article (Advanced Functional Materials, 2023) · cited 30× · AI/ML

**Wikidata**: [openalex:W4319788293](https://www.wikidata.org/wiki/openalex:W4319788293)  
**Source**: https://4ort.xyz/entity/hightemporalresolution-characterization-reveals-outstanding-random-telegraph-noise-and-the-origin-of-dielectric-breakdow