# High-Throughput Screening of Extrinsic Point Defect Properties in Si and Ge: Database and Applications

> Research article (Chemistry of Materials, 2016) · cited 14× · AI/ML

**Wikidata**: [openalex:W2566177661](https://www.wikidata.org/wiki/openalex:W2566177661)  
**Source**: https://4ort.xyz/entity/high-throughput-screening-of-extrinsic-point-defect-properties-in-si-and-ge-database-and-applications