# High-Field Stress, Low-Frequency Noise, and Long-Term Reliability of AlGaN/GaN HEMTs

> Research article (IEEE Transactions on Device and Materials Reliability, 2016) · cited 36× · AI/ML

**Wikidata**: [openalex:W2421174740](https://www.wikidata.org/wiki/openalex:W2421174740)  
**Source**: https://4ort.xyz/entity/high-field-stress-low-frequency-noise-and-long-term-reliability-of-algan-gan-hemts