# High-Dimensional and Multiple-Failure-Region Importance Sampling for SRAM Yield Analysis

> Research article (IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2016) · cited 38× · AI/ML

**Wikidata**: [openalex:W2519965010](https://www.wikidata.org/wiki/openalex:W2519965010)  
**Source**: https://4ort.xyz/entity/high-dimensional-and-multiple-failure-region-importance-sampling-for-sram-yield-analysis