# HIER: Metric Learning Beyond Class Labels via Hierarchical Regularization

> Research article (2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2023) · cited 21× · AI/ML

**Wikidata**: [openalex:W4386076191](https://www.wikidata.org/wiki/openalex:W4386076191)  
**Source**: https://4ort.xyz/entity/hier-metric-learning-beyond-class-labels-via-hierarchical-regularization