# Height-resolved quantification of microstructure and texture in polycrystalline thin films using TEM orientation mapping

> Research article (Ultramicroscopy, 2015) · cited 14× · AI/ML

**Wikidata**: [openalex:W1894916795](https://www.wikidata.org/wiki/openalex:W1894916795)  
**Source**: https://4ort.xyz/entity/height-resolved-quantification-of-microstructure-and-texture-in-polycrystalline-thin-films-using-tem-orientation-mapping