# Hardware Demonstration of Atomic Force Microscopy Imaging Via Compressive Sensing and <tex>$\mu$</tex>-Path Scans

> Research article (2018 Annual American Control Conference (ACC), 2018) · cited 12× · AI/ML

**Wikidata**: [openalex:W2885336113](https://www.wikidata.org/wiki/openalex:W2885336113)  
**Source**: https://4ort.xyz/entity/hardware-demonstration-of-atomic-force-microscopy-imaging-via-compressive-sensing-and-lt-tex-gt-mu-lt-tex-gt-path-scans