# Graph Embedding and Optimal Transport for Few-Shot Classification of Metal Surface Defect

> Research article (IEEE Transactions on Instrumentation and Measurement, 2022) · cited 49× · AI/ML

**Wikidata**: [openalex:W4226300953](https://www.wikidata.org/wiki/openalex:W4226300953)  
**Source**: https://4ort.xyz/entity/graph-embedding-and-optimal-transport-for-few-shot-classification-of-metal-surface-defect