# GR-Noise Characterization of Ge pFinFETs With STI First and STI Last Processes

> Research article (IEEE Electron Device Letters, 2016) · cited 10× · AI/ML

**Wikidata**: [openalex:W2481004426](https://www.wikidata.org/wiki/openalex:W2481004426)  
**Source**: https://4ort.xyz/entity/gr-noise-characterization-of-ge-pfinfets-with-sti-first-and-sti-last-processes