# Generative Adversarial Networks for Synthetic Defect Generation in Assembly and Test Manufacturing

> Research article (2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2020) · cited 23× · AI/ML

**Wikidata**: [openalex:W3083255361](https://www.wikidata.org/wiki/openalex:W3083255361)  
**Source**: https://4ort.xyz/entity/generative-adversarial-networks-for-synthetic-defect-generation-in-assembly-and-test-manufacturing