# Generating Single- and Double-Pattern Tests for Multiple CMOS Fault Models in One ATPG Run

> Research article (IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2019) · cited 18× · AI/ML

**Wikidata**: [openalex:W2969852599](https://www.wikidata.org/wiki/openalex:W2969852599)  
**Source**: https://4ort.xyz/entity/generating-single-and-double-pattern-tests-for-multiple-cmos-fault-models-in-one-atpg-run