# From Sample Poverty to Rich Feature Learning: A New Metric Learning Method for Few-Shot Classification

> Research article (IEEE Access, 2024) · cited 37× · AI/ML

**Wikidata**: [openalex:W4401634206](https://www.wikidata.org/wiki/openalex:W4401634206)  
**Source**: https://4ort.xyz/entity/from-sample-poverty-to-rich-feature-learning-a-new-metric-learning-method-for-few-shot-classification