# From IC debug to hardware security risk: The power of backside access and optical interaction

> Research article (2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2016) · cited 30× · AI/ML

**Wikidata**: [openalex:W2520282831](https://www.wikidata.org/wiki/openalex:W2520282831)  
**Source**: https://4ort.xyz/entity/from-ic-debug-to-hardware-security-risk-the-power-of-backside-access-and-optical-interaction