# Frequency domain scanning acoustic microscopy for power electronics: Physics-based feature identification and selectivity

> Research article (Microelectronics Reliability, 2018) · cited 10× · AI/ML

**Wikidata**: [openalex:W2894632451](https://www.wikidata.org/wiki/openalex:W2894632451)  
**Source**: https://4ort.xyz/entity/frequency-domain-scanning-acoustic-microscopy-for-power-electronics-physics-based-feature-identification-and-selectivity
