# Forecasting the yield of wafer by using improved genetic algorithm, high dimensional alternating feature selection and SVM with uneven distribution and high-dimensional data

> Research article (Autonomous Intelligent Systems, 2022) · cited 13× · AI/ML

**Wikidata**: [openalex:W4297222725](https://www.wikidata.org/wiki/openalex:W4297222725)  
**Source**: https://4ort.xyz/entity/forecasting-the-yield-of-wafer-by-using-improved-genetic-algorithm-high-dimensional-alternating-feature-selection-and-sv