# Focused Ion Beam-Based Specimen Preparation for Atom Probe Tomography

> Research article (Han-guk hyeonmigyeong hakoeji/Applied microscopy, 2016) · cited 11× · AI/ML

**Wikidata**: [openalex:W2313922122](https://www.wikidata.org/wiki/openalex:W2313922122)  
**Source**: https://4ort.xyz/entity/focused-ion-beam-based-specimen-preparation-for-atom-probe-tomography