# Focal Auxiliary Classifier Generative Adversarial Network for Defective Wafer Pattern Recognition with Imbalanced Data

> Research article (2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 2021) · cited 12× · AI/ML

**Wikidata**: [openalex:W3163598514](https://www.wikidata.org/wiki/openalex:W3163598514)  
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