# Fixed Pattern Noise and Temporal Noise Degradation Induced by Radiation Effects in Pinned Photodiode CMOS Image Sensors

> Research article (IEEE Transactions on Nuclear Science, 2018) · cited 24× · AI/ML

**Wikidata**: [openalex:W2803705362](https://www.wikidata.org/wiki/openalex:W2803705362)  
**Source**: https://4ort.xyz/entity/fixed-pattern-noise-and-temporal-noise-degradation-induced-by-radiation-effects-in-pinned-photodiode-cmos-image-sensors