# Five-second STEM dislocation tomography for 300 nm thick specimen assisted by deep-learning-based noise filtering

> Research article (Scientific Reports, 2021) · cited 22× · AI/ML

**Wikidata**: [openalex:W3208218672](https://www.wikidata.org/wiki/openalex:W3208218672)  
**Source**: https://4ort.xyz/entity/five-second-stem-dislocation-tomography-for-300-nm-thick-specimen-assisted-by-deep-learning-based-noise-filtering