# Fine-Grained Aging-Induced Delay Prediction Based on the Monitoring of Run-Time Stress

> Research article (IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2016) · cited 43× · AI/ML

**Wikidata**: [openalex:W2537914985](https://www.wikidata.org/wiki/openalex:W2537914985)  
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