# Few-shot fault identification of complex equipment via metric-based features capture GAN combining prior knowledge-augmented strategy

> Research article (Journal of Manufacturing Systems, 2023) · cited 16× · AI/ML

**Wikidata**: [openalex:W4387005349](https://www.wikidata.org/wiki/openalex:W4387005349)  
**Source**: https://4ort.xyz/entity/few-shot-fault-identification-of-complex-equipment-via-metric-based-features-capture-gan-combining-prior-knowledge-augme